Defect detection automated in diamond, other advanced semiconductors

Materials scientists at Rice University have developed a new workflow methodology for measuring microscopic defects in ...
Nature

Defect Characterization and Control in 2D Materials and Devices

The rapid advancement of 2D materials (2DMs), such as graphene, transition metal dichalcogenides (TMDs), and hexagonal boron nitride (hBN), has revolutionized the field of nanotechnology and ...
Semiconductor Engineering

Observability Is A Missing Layer In AI-Era Chiplet Design

In next-generation silicon, AI can interpret system behavior at scale, but only if observability is designed into the fabric ...
Fabbaloo

Deep Learning Spots 3D Print Defects In Process

A new study explores deep learning for image-based defect detection during 3D printing, looking to catch bad builds.