Unlike almost every other kind of microscope, atomic-force microscopes (AFMs) don’t use any kind of optical beam to image ...
Abstract: In this article, a new concept to improve the angular stability of linear-to-circular polarizing reflectors is presented. It is first explicitly demonstrated that existing design approaches ...
Abstract: An on-chip, high-extinction-ratio transverse electric (TE) pass polarizer utilizing a silicon oxynitride (SiON) slab has been proposed and experimentally verified. The power confinement ...
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